Heterodyne temporal speckle-pattern interferometry

被引:24
作者
Haible, P [1 ]
Kothiyal, MP [1 ]
Tiziani, HJ [1 ]
机构
[1] Univ Stuttgart, Inst Tech Opt, D-70569 Stuttgart, Germany
关键词
D O I
10.1364/AO.39.000114
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In temporal speckle-pattern interferometry deformation information is extracted by a Fourier transform technique from the speckle pattern that is recorded over a period of time as the object is deformed. A limitation of the experimental arrangements reported to date is that the direction of the deformation cannot be determined. We propose removing this limitation by using the heterodyne principle. Some experimental results that were obtained by use of a rotating half-wave-plate frequency shifter are presented. (C) 2000 Optical Society of America OCIS codes: 120.6160, 040.2840.
引用
收藏
页码:114 / 117
页数:4
相关论文
共 10 条
[1]   Speckle interferometry with temporal phase evaluation for measuring large-object deformation [J].
Joenathan, C ;
Franze, B ;
Haible, P ;
Tiziani, HJ .
APPLIED OPTICS, 1998, 37 (13) :2608-2614
[2]   Speckle interferometry with temporal phase evaluation: influence of decorrelation, speckle size, and nonlinearity of the camera [J].
Joenathan, C ;
Haible, P ;
Tiziani, HJ .
APPLIED OPTICS, 1999, 38 (07) :1169-1178
[3]   Shape measurement by use of temporal Fourier transformation in dual-beam illumination speckle interferometry [J].
Joenathan, C ;
Franze, B ;
Haible, P ;
Tiziani, HJ .
APPLIED OPTICS, 1998, 37 (16) :3385-3390
[4]   Novel temporal Fourier transform speckle pattern shearing interferometer [J].
Joenathan, C ;
Franze, B ;
Haible, P ;
Tiziani, HJ .
OPTICAL ENGINEERING, 1998, 37 (06) :1790-1795
[5]  
Joenathan C, 1998, J MOD OPTIC, V45, P1975, DOI 10.1080/09500349808231715
[6]  
JOENATHAN C, UNPUB EXP MECH
[7]   OPTICAL FREQUENCY SHIFTER FOR HETERODYNE INTERFEROMETRY USING COUNTERROTATING WAVE PLATES [J].
KOTHIYAL, MP ;
DELISLE, C .
OPTICS LETTERS, 1984, 9 (08) :319-321
[8]   UP-DOWN FREQUENCY SHIFTER FOR OPTICAL HETERODYNE INTERFEROMETRY [J].
SOMMARGREN, GE .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1975, 65 (08) :960-961
[9]   WAVELENGTH-SHIFT INTERFEROMETRY FOR DISTANCE MEASUREMENTS USING THE FOURIER-TRANSFORM TECHNIQUE FOR FRINGE ANALYSIS [J].
SUEMATSU, M ;
TAKEDA, M .
APPLIED OPTICS, 1991, 30 (28) :4046-4055
[10]   FOURIER-TRANSFORM METHOD OF FRINGE-PATTERN ANALYSIS FOR COMPUTER-BASED TOPOGRAPHY AND INTERFEROMETRY [J].
TAKEDA, M ;
INA, H ;
KOBAYASHI, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (01) :156-160