Soft X-ray magnetic scattering from striped magnetic domain structures

被引：9

作者：

van der Laan, G ^{[1
]}

Dudzik, E

Collins, SP

Dhesi, SS

Dürr, HA

Belakhovsky, M

Chesnel, K

Marty, A

Samson, Y

Gilles, B

机构：

[1] SERC, Daresbury Lab, Magnet Spect Grp, Warrington WA4 4AD, Cheshire, England

[2] CEA Grenoble, Serv Phys Mat & Microstruct, F-38054 Grenoble, France

来源：

PHYSICA B | 2000年 / 283卷 / 1-3期

关键词：

magnetic domains; X-ray scattering; thin-film technology; circular dichroism; phase relation;

D O I：

10.1016/S0921-4526(99)01925-0

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We show that the magnetization profile of magnetic patterns in thin films can be obtained by using circular dichroism to recover the phase relation in X-ray resonant magnetic scattering. This is demonstrated for single-crystalline FePd layers with striped magnetic domain pattern where we obtain unambiguous evidence for the presence of magnetic flux closure domains. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：171 / 174

页数：4

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