AFM characterization of the growth of MFI-type zeolite films on alumina substrates

被引:18
作者
Vilaseca, M
Mateo, E
Palacio, L
Prádanos, P
Hernández, A
Paniagua, A
Coronas, J
Santamaría, J
机构
[1] Univ Zaragoza, Dept Chem & Environm Engn, Ctr Politech Super, Zaragoza 50018, Spain
[2] Univ Valladolid, Dept Thermodynam & Appl Phys, E-47071 Valladolid, Spain
[3] Univ Zaragoza, Dept Earth Sci, E-50009 Zaragoza, Spain
关键词
AFM; MFI-type zeolite; zeolite supported growth; zeolite membrane; large zeolite crystal;
D O I
10.1016/j.micromeso.2004.03.020
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Layers of b-oriented silicalite crystals formed on alumina substrates were characterized by SEM and AFM. At short synthesis times, small 10-40 nm nuclei were found on the surfaces of the alumina particles of the support and also on the faces of well developed silicalite crystals. After a certain period of time, these nuclei are dissolved or incorporated into the growing crystals and only crystal growth can be observed. Large silicalite crystals (up to 3 mm in size) were also synthesized as a way to obtain a silicalite standard. The nanostructure of the nuclei above mentioned revealed by AFM was in agreement with that of a well growth large silicalite crystal. (C) 2004 Elsevier Inc. All rights reserved.
引用
收藏
页码:33 / 37
页数:5
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