Wavelet analysis for classification of multi-source PD patterns

被引:81
作者
Lalitha, EM [1 ]
Satish, L [1 ]
机构
[1] Indian Inst Sci, Dept High Voltage Eng, Bangalore 560012, Karnataka, India
关键词
D O I
10.1109/94.839339
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multi-resolution signal decomposition (MSD) technique of wavelet transforms has interesting properties of capturing the embedded horizontal, vertical and diagonal variations within an image in a separable farm. This feature was exploited to identify individual partial discharge (PD) sources present in multi-source PD Patterns, usually encountered during practical PD measurements, Employing the Daubechies wavelet, features were extracted from the third level decomposed and reconstructed horizontal and vertical component images. These features were found to contain the necessary discriminating information corresponding to the individual PD sources, Suitability of these extracted features for classification was further verified using a radial basis function neural network(NN). Successful recognition was achieved, even when the constituent sources produced partially and fully overlapping patterns, thus demonstrating the applicability of the proposed novel approach for the task of multi-source PD classification.
引用
收藏
页码:40 / 47
页数:8
相关论文
共 14 条
[1]  
BINDER E, CIGRE SESS 1998
[2]  
CACCIARI M, 1996, C EL INS DIEL PHEN S, P476
[3]   PD RECOGNITION WITH KNOWLEDGE-BASED PREPROCESSING AND NEURAL NETWORKS [J].
CACHIN, C ;
WIESMANN, HJ .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1995, 2 (04) :578-589
[4]   COMPUTER-AIDED RECOGNITION OF DISCHARGE SOURCES [J].
GULSKI, E ;
KREUGER, FH .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1992, 27 (01) :82-92
[5]  
HAYKINS S, NEURAL NETWORKS COMP
[6]  
*IEC, 1995, 60270 IEC
[7]  
Konig D., 1993, PARTIAL DISCHARGES E
[8]  
Krivda A, 1997, PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, P206, DOI 10.1109/ICPADM.1997.617564
[9]   Fractal image compression for classification of PD sources [J].
Lalitha, EM ;
Satish, L .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 1998, 5 (04) :550-557
[10]  
Lee JH, 1997, PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, P307, DOI 10.1109/ICPADM.1997.617589