A genetic based algorithm for voltage flicker measurement

被引：22

作者：

Al-Hasawi, WM ^{[1
]}

El-Naggar, KM ^{[1
]}

机构：

[1] Coll Technol Studies, Dept Elect Engn, Hawali 32084, Kuwait

来源：

INTERNATIONAL JOURNAL OF ELECTRICAL POWER & ENERGY SYSTEMS | 2004年 / 26卷 / 08期

关键词：

flicker voltage; flicker frequency; measurement; genetic algorithms; optimization;

D O I：

10.1016/j.ijepes.2004.04.003

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Measurements of voltage flicker levels and its frequency is of great concern to the utility in order to prevent unacceptable voltage fluctuation in the supplying system. This paper introduces a new digital approach for the measurements of voltage flicker and its frequency using the Genetic Algorithm (GAs) optimization technique. The algorithm is tested using simulated data. Effects of number of samples, sampling frequency and the sample window size are studied. Effects of GAs parameters and operators, such as population size, crossover, mutation probabilities, niching and fitness functions are also studied. Results are reported and discussed. (C) 2004 Elsevier Ltd. All rights reserved.

引用

页码：593 / 596

页数：4

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