Improved microwave imaging procedure for nondestructive evaluations of two dimensional structures

An improved microwave procedure for detecting defects in dielectric structures is proposed. The procedure is based on the integral equations of the inverse scattering problem. A hybrid genetic algorithm (GA) is applied in order to minimize the obtained nonlinear functional. Since in nondestructive evaluations the unperturbed object is completely known, it is possible off-line to numerically compute the. Green's function for the configuration without defects. Consequently, a very significant computation saving is obtained, since the "chromosome" of the GA codes only the parameters describing the unknown defect.