Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

被引：14

作者：

Alders, D

Hibma, T

Sawatzky, GA

Cheung, KC

vanDorssen, GE

Roper, MD

Padmore, HA

vanderLaan, G

Vogel, J

Sacchi, M

机构：

[1] SERC,DARESBURY LAB,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND

[2] UNIV PARIS 11,UTILISAT RAYONNEMENT ELECTROMAGNET LAB,F-91405 ORSAY,FRANCE

来源：

JOURNAL OF APPLIED PHYSICS | 1997年 / 82卷 / 06期

关键词：

D O I：

10.1063/1.366153

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on a study of grazing incidence absorption and reflection spectra of NiO in the region of the Ni 2p edge. The aim is to evaluate the distortion of the near edge spectrum by the critical angle behavior of individual components within the spectrum. This can be used to improve the separation of multiplets and enhance low spectral weight line shapes like charge transfer satellites. The measured spectra have been compared with calculations using an optical model. (C) 1997 American Institute of Physics.

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页码：3120 / 3124

页数：5

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