Grain boundary enrichment in the FePt polymorphic A1 to L10 phase transformation

被引：21

作者：

Torres, K. L. ^{[1
]}

Thompson, G. B. ^{[1
]}

机构：

[1] Univ Alabama, Dept Met & Mat Engn, Tuscaloosa, AL 35487 USA

来源：

ULTRAMICROSCOPY | 2009年 / 109卷 / 05期

关键词：

Thin films; Atom probe tomography; FePt; Segregation; Phase transformation; GROWTH TEMPERATURE-DEPENDENCE; MAGNETIC-PROPERTIES;

D O I：

10.1016/j.ultramic.2008.10.029

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A series of Fe54 +/- 1Pt46 +/- 1 thin films have been sputter-deposited and annealed at various times and temperatures to facilitate the A1 to L1(0) polymorphic phase transformation. The annealing times span one minute to tens of minutes over temperatures of 300-800 degrees C. The films were characterized by X-ray and electron diffraction and atom probe tomography. This time-temperature regime provides. snap-shots' into the compositional segregation evolution at the grain boundaries during the polymorphic phase transformation. The as-deposited A1 phase showed a preferential segregation of Pt to the grain boundaries. The reduction of Pt enrichment at the boundaries was observed for all L1(0) ordered films. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：606 / 611

页数：6

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