Energy dependence of projectiles on ion formation in electrospray droplet impact SIMS

被引:16
作者
Asakawa, Daiki [1 ]
Mori, Kunihiko [1 ]
Hiraoka, Kenzo [1 ]
机构
[1] Univ Yamanashi, Clean Energy Res Ctr, Kofu, Yamanashi 4008511, Japan
关键词
SIMS; EDI; Shock wave; Electrospray; Cluster;
D O I
10.1016/j.apsusc.2008.05.146
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Charged electrospray droplets are introduced in vacuum and are allowed to impact the metal target. The secondary ions generated are measured by an orthogonal time-of-flight mass spectrometer. For the self-assembled monolayer as a sample, the ionization/desorption of monolayer molecules is observed without fragmentation. The secondary ion abundances for various samples deposited on the metal substrate are measured as a function of the acceleration voltage of the projectiles. There are found two threshold behaviors for secondary ion formation, i.e., low-energy and high-energy regimes. In the low-energy regime, desorption of the samples deposited on the metal target starts but no ionization takes place. In the high-energy regime, kinetic energy of the projectile is converted to internal energies for the system taking part in the collision and molecules deposited on the metal substrate are ionized/desorbed. There are found two modes of fragmentation for rhodamine B and crystal violet in the high-energy regime. When N-2 was deposited on the metal substrate at similar to 17 K, ion signals decreased suddenly. This is due to the drastic change of energy dissipation processes in the high-momentum collision. (C) 2008 Published by Elsevier B.V.
引用
收藏
页码:1217 / 1222
页数:6
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