LEED crystallographic analysis for the Rh(111)-(root 7x root 7)R19.1 degrees-P surface structure

被引：9

作者：

Liu, W ^{[1
]}

Wong, KC ^{[1
]}

Mitchell, KAR ^{[1
]}

机构：

[1] UNIV BRITISH COLUMBIA,DEPT CHEM,VANCOUVER,BC V6T 1Z1,CANADA

来源：

SURFACE SCIENCE | 1997年 / 372卷 / 1-3期

基金：

加拿大自然科学与工程研究理事会;

关键词：

low energy electron diffraction; low index single crystal surface; phosphorus; rhodium; surface relaxation and reconstruction;

D O I：

10.1016/S0039-6028(96)01119-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A recent communication [11] reported a novel structure for the (root 7 x root 7)R19.1 degrees reconstruction formed by P on the Rh(111) surface, and the present paper details the associated tensor LEED analysis. This reconstruction involves a packed arrangement of Rh pentagons and triangles for the topmost layer, with P atoms at 3/7 monolayer coverage occupying eight-coordinate sites created by the Rh pentagons. The nearly flat, densely packed Rh-P mixed layer (density of five Rh and three P atoms per seven Rh atoms in the substrate unit mesh) appears to provide a major stabilizing effect on this surface. The average P-Rh bond distance is indicated to be 2.52 Angstrom, slightly longer than that (2.38 A) in bulk Rh2P where the P atoms are also eight-coordinate. Some similarities are noted with the corresponding (rv (7) over bar x root 7)R19.1 degrees structures formed by S on the Pd(111), Cu(111) and Ag(111) surfaces.

引用

页码：312 / 322

页数：11

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