Determination of interference-free optical constants of thin films

被引：8

作者：

Mahanty, S ^{[1
]}

Basak, D ^{[1
]}

Merino, JM ^{[1
]}

Leon, M ^{[1
]}

机构：

[1] Univ Autonoma Madrid, Dept Fis Aplicada, Madrid 28049, Spain

来源：

MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1999年 / 68卷 / 02期

关键词：

thin films; optical constants; band gap; copper indium gallium selenide; stibnite;

D O I：

10.1016/S0921-5107(99)00518-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A computational procedure has been developed for the accurate determination of interference-free optical constants (refractive index, n(l) and extinction coefficient, k(l)) of thin solid films from reflectance (R) and transmittance (T) measurements. By using (1 - R)/T function and a successive refinement loop, error in calculation of the absorption coefficient (alpha) has been minimized. The method has been successfully used for the determination of optical constants and band Sap of CuIn1 - x GaxSe2 and Sb2S3 thin films. (C) 1999 Elsevier Science S.A. All rights reserved.

引用

页码：72 / 75

页数：4

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