High transmittance TFT-LCD panels using low-k CVD films

被引:13
作者
Hong, WS [1 ]
Jung, KW
Choi, JH
Hwang, BK
Chung, KH
机构
[1] Sejong Univ, Dept Elect Engn, Seoul 143747, South Korea
[2] Samsung Elect Co, AMLCD Div, Yongin 449711, South Korea
[3] Dow Corning Corp, Elect Ind & Adv Business, Midland, MI 48686 USA
关键词
aperture ratio; dielectric constant; passivation; TFT-LCD;
D O I
10.1109/LED.2004.828957
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thin-film transistor liquid crystal display (TFT-LCD) panels of a high transmittance structure were fabricated by using a low-kappa dielectric film as a passivation layer. The low-dielectric films were successfully deposited and patterned using a conventional plasma-enhanced chemical vapor deposition (PECVD) and plasma-assisted etching techniques. The interface between the a-Si channel and the overlaying passivation was modified by appropriate plasma treatment prior to the low-kappa deposition. TFTs having the a-Si:C:O:H passivation showed a transfer characteristics similar to that of conventional TFTs. The high transmittance panel showed brightness approximately 30% higher than that of a standard panel without degrading other display characteristics, such as crosstalk.
引用
收藏
页码:381 / 383
页数:3
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