On the formation mechanism of γ-AgI thin films

被引:35
作者
Kumar, PS [1 ]
Dayal, PB [1 ]
Sunandana, CS [1 ]
机构
[1] Univ Hyderabad, Sch Phys, Hyderabad 500046, Andhra Pradesh, India
关键词
iodization; gravimetry; stacking faults; optical band gap;
D O I
10.1016/S0040-6090(99)00647-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Programmed iodization of silver foils at ambient temperature and pressure leads to the formation of gamma-AgI films with zinc-blende structure. Gravimetric experiments show that the AgI film formation follows a parabolic time dependence. X-ray diffraction monitoring of the film formation on unannealed, annealed and etched silver foils reveals that the absence of intrinsic stacking faults is a necessary condition for the formation of gamma-AgI thin films and that the presence of such faults invariably results in the formation of beta-AgI thin films. Optical absorption studies indicate eventual saturation of the direct optical band gap with increase in iodination time, which corroborates Xray diffraction and gravimetry results. (C) 1999 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:111 / 118
页数:8
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