Electrical conductivity of YSZ film grown by pulsed laser deposition

被引：137

作者：

Joo, Jong Hoon

Choi, Gyeong Man ^{[1
]}

机构：

[1] Pohang Univ Sci & Technol, Fuel Cell Res Ctr, Pohang 790784, Gyeongbuk, South Korea

[2] Pohang Univ Sci & Technol, Dept Mat Sci & Engn, Pohang 790784, Gyeongbuk, South Korea

来源：

SOLID STATE IONICS | 2006年 / 177卷 / 11-12期

关键词：

SOFC; electrical conductivity; thin film; YSZ; PLD;

D O I：

10.1016/j.ssi.2006.04.008

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Yttria-stabilized zirconia (YSZ) thin films, 0.6-1.5 mu m, were deposited on Pt and sapphire substrates by a pulsed laser deposition (PLD) method. Their structural and transport properties have been studied by means of X-ray diffraction and electrical conductivity measurements. The in-plane and the perpendicular-to-plane conductivities (hereafter, "across-plane" conductivity) of thin films were measured and compared to that of bulk sample. X-ray diffraction and electron microscopy results showed that the films on Pt and sapphire were polycrystalline cubic with a columnar structure. Both the across-plane and the in-plane conductivities of YSZ thin film were close to that of bulk specimens. Thus no conductivity enhancement was found for the present nano-crystalline YSZ films (grain or column size, 60 similar to 100 nm). (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：1053 / 1057

页数：5

共 16 条

[1]

Chrisey D. B., 1994, PULSED LASER DEPOSIT

[2] Electrodes and electrolytes in micro-SOFCs: a discussion of geometrical constraints [J].