Atomic structure of carbon nanotubes from scanning tunneling microscopy

被引:155
作者
Venema, LC
Meunier, V
Lambin, P
Dekker, C
机构
[1] Delft Univ Technol, Dept Appl Sci, NL-2628 CJ Delft, Netherlands
[2] Delft Univ Technol, DIMES, NL-2628 CJ Delft, Netherlands
[3] Fac Univ Notre Dame Paix, Dept Phys, B-5000 Namur, Belgium
关键词
D O I
10.1103/PhysRevB.61.2991
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The atomic structure of a carbon nanotube can be described by its chiral angle and diameter and can be specified by a pair of lattice indices (n,m). The electronic and mechanical properties are critically dependent on these indices, Scanning tunneling microscopy (STM) is a useful tool to investigate carbon nanotubes since the atomic structure as well as the electronic properties of individual molecules can be determined. This paper presents a discussion of the technique to obtain (n,m) indices of nanotubes from STM images in combination with current-voltage tunnel spectra. image contrast, distortion effects, and determination of chiral angle and diameter are discussed. The procedure of(n,m) identification is demonstrated for a few single-walled carbon nanotubes.
引用
收藏
页码:2991 / 2996
页数:6
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