In situ X-ray absorption near edge structure studies of mechanisms of passivity

被引：21

作者：

Virtanen, S ^{[1
]}

Schmuki, P

Isaacs, HS

机构：

[1] ETH Honggerberg, Swiss Fed Inst Technol, Inst Mat Chem & Corros, CH-8093 Zurich, Switzerland

[2] ETH Honggerberg, Swiss Fed Inst Technol, Dept Mat, CH-8093 Zurich, Switzerland

[3] Univ Erlangen Nurnberg, LKO, Dept Mat Sci, Chair Surface Sci & Corros, D-91058 Erlangen, Germany

[4] Brookhaven Natl Lab, Div Mat Sci, Energy Sci & Technol Dept, Upton, NY 11973 USA

来源：

ELECTROCHIMICA ACTA | 2002年 / 47卷 / 19期

关键词：

X-ray absorption near edge structure; passivity; passive films; Fe-Cr; corrosion;

D O I：

10.1016/S0013-4686(02)00230-X

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

The goal of this paper is to illustrate how in situ X-ray absorption near edge structure (XANES) investigations can give a more detailed understanding of the function of various parameters on the mechanisms of passivity. In situ XANES has been used to monitor changes in oxidation state under electrochemical control that lead to a solid-state conversion or dissolution of metal or oxide. Recent studies on native and artificial passive films-mainly Fe, Cr and Fe-Cr alloys, are employed for this purpose. (C) 2002 Elsevier Science Ltd. All rights reserved.

引用

页码：3117 / 3125

页数：9

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