Speed and power scaling of SRAM's

被引:68
作者
Amrutur, BS [1 ]
Horowitz, MA [1 ]
机构
[1] Stanford Univ, Ctr Integrated Syst, Stanford, CA 94305 USA
关键词
delay scaling; power scaling; scaling; speed scaling; static random access memory (SRAM); technology scaling;
D O I
10.1109/4.823443
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Simple models for the delay, power, and area of a static random access memory (SRAM) are used to determine the optimal organizations for a SRAM and study the scaling of their speed and power with size and technology. The delay is found to increase by about one gate delay for every doubling of the RAM-size up to 1 Mb, beyond which the interconnect delay becomes an increasingly significant fraction of the total delay. With technology sealing, the nonscaling of threshold mismatches in the sense amplifiers is found to significantly impact the total delay in generations of 0.1 mu m and below.
引用
收藏
页码:175 / 185
页数:11
相关论文
共 23 条
[1]   A replica technique for wordline and sense control in low-power SRAM's [J].
Amrutur, BS ;
Horowitz, MA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (08) :1208-1219
[2]   OPTIMAL INTERCONNECTION CIRCUITS FOR VLSI [J].
BAKOGLU, HB ;
MEINDL, JD .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (05) :903-909
[3]   A 2-NS CYCLE, 3.8-NS ACCESS 512-KB CMOS ECL SRAM WITH A FULLY PIPELINED ARCHITECTURE [J].
CHAPPELL, TI ;
CHAPPELL, BA ;
SCHUSTER, SE ;
ALLAN, JW ;
KLEPNER, SP ;
JOSHI, RV ;
FRANCH, RL .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1991, 26 (11) :1577-1585
[5]   ENERGY-CONSUMPTION MODELING AND OPTIMIZATION FOR SRAMS [J].
EVANS, RJ ;
FRANZON, PD .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1995, 30 (05) :571-579
[6]  
EVANS RJ, 1993, THESIS N CAROLINA ST
[7]  
HIGUCHI T, 1996, 500MHZ SYNCHRONOUS P
[8]  
Ishibashi Koichiro, 1995, IEEE J SOLID STATE C, V30
[9]   CMOS TAPERED BUFFER [J].
LI, NC ;
HAVILAND, GL ;
TUSZYNSKI, AA .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (04) :1005-1008
[10]   A 15-NS 16-MB CMOS SRAM WITH INTERDIGITATED BIT-LINE ARCHITECTURE [J].
MATSUMIYA, M ;
KAWASHIMA, S ;
SAKATA, M ;
OOKURA, M ;
MIYABO, T ;
KOGA, T ;
ITABASHI, K ;
MIZUTANI, K ;
SHIMADA, H ;
SUZUKI, N .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1992, 27 (11) :1497-1503