Surface enrichment in a miscible polymer blend: An experimental test of self-consistent field and long-wavelength approximation models

被引:35
作者
Genzer, J
Faldi, A
Oslanec, R
Composto, RJ
机构
[1] UNIV PENN, DEPT MAT SCI & ENGN, PHILADELPHIA, PA 19104 USA
[2] UNIV PENN, DEPT MAT SCI & ENGN, PHILADELPHIA, PA 19104 USA
[3] UNIV PENN, RES STRUCT MATTER LAB, PHILADELPHIA, PA 19104 USA
关键词
D O I
10.1021/ma951108f
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Neutron reflectivity (NR) and low-energy forward recoil spectrometry (LE-FRES) were used to study surface enrichment in miscible blends of deuterated polystyrene, d-PS, and poly(styrene-co-4-bromostyrene), PBr0.049S, having a 0.049 mole fraction of 4-bromostyrene units. The d-PS component was found to segregate preferentially to the polymer blend/air interface, whereas no enrichment of either component was detected at the polymer blend/silicon interface. The experimental values of the surface concentration, phi(1), and the surface excess, z*, of d-PS were interpreted using both the theory of Schmidt and Binder (SE) (J. Phys. II (Paris) 1985, 46, 1631) and the self-consistent field (SCF) approach of Genzer et al. (Phys. Rev. E 1994, 50, 2373). Although both SE and SCF models were found to be in good qualitative agreement with the experimentally measured values of phi(1) and z*, we demonstrate that the latter proves to be in better quantitative agreement with the experimental results. Moreover, a comparison of the SE and SCF volume fraction profiles of d-PS revealed that the SCF model described more accurately the experimental profile. We also demonstrated that adding long-range interactions to the surface potential in the SCF model produced just minor changes in the shape of the d-PS profile near the surface.
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页码:5438 / 5445
页数:8
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