Allocation of chips to wafers in a production problem of semiconductor kits

被引:4
作者
Seshadri, S [1 ]
Shanthikumar, JG [1 ]
机构
[1] UNIV CALIF BERKELEY, HAAS SCH BUSINESS, DEPT MFG & INFORMAT TECHNOL, BERKELEY, CA 94720 USA
关键词
D O I
10.1287/opre.45.2.315
中图分类号
C93 [管理学];
学科分类号
12 ; 1201 ; 1202 ; 120202 ;
摘要
The problem of maximizing the production of good sets of semiconductor chips under random yield is reexamined in this paper. (A set of semiconductor chips is called a semiconductor kit.) This problem has been considered by Avram and Wein (1992) and Singh et al. (1988). To solve this problem we show that under certain combinations of assumptions the production process can be replaced by a black box The use of the black box model considerably simplifies the analysis and reduces the simulation effort required for carrying out parametric analysis of the proposed solution procedure. The model includes that of Avram and Wein, and we ext:end their results to more general settings and strengthen their conclusions. Using the black box model, it is shown that the strategy of placing different types of chips on a single wafer gives larger yield of kits in a stochastic sense than the traditional method of placing single types of chips on a wafer. We compare the production of kits under different chip design and lot release policies and also carry out a parametric analysis with respect to factors such as set proportions and yield.
引用
收藏
页码:315 / 321
页数:7
相关论文
共 10 条
[1]   A PRODUCT DESIGN PROBLEM IN SEMICONDUCTOR MANUFACTURING [J].
AVRAM, F ;
WEIN, LM .
OPERATIONS RESEARCH, 1992, 40 (05) :986-998
[2]   Methods for job configuration in semiconductor manufacturing [J].
Connors, DP ;
Yao, DD .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1996, 9 (03) :401-411
[3]  
FERRISPRABHU AV, 1987, IEEE CIRCUITS DEVICE
[4]   A DISCUSSION OF YIELD MODELING WITH DEFECT CLUSTERING, CIRCUIT REPAIR, AND CIRCUIT REDUNDANCY [J].
MICHALKA, TL ;
VARSHNEY, RC ;
MEINDL, JD .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1990, 3 (03) :116-127
[5]  
SINGH MR, 1988, 5 IEEE CHMT INT EL M
[7]  
Stoyan D., 1983, COMP METHODS QUEUES
[8]  
Sze SM, 1988, VLSI TECHNOLOGY
[9]  
Tong Y., 1990, The Multivariate Normal Distribution
[10]  
STATISTICAL THEORY R