Multi-structure ion sensitive field effect transistor with a metal light shield

被引:15
作者
Liao, HK
Wu, CL
Chou, JC
Chung, WY
Sun, TP
Hsiung, SK [1 ]
机构
[1] Chung Yuan Christian Univ, Dept Elect Engn, Chungli 320, Taiwan
[2] Natl Yunlin Univ Sci & Technol, Inst Elect & Informat Engn, Touliu 640, Yunlin, Taiwan
[3] Chung Yu Jr Coll Business & Adm, Dept Management Informat Syst, Keelung 201, Taiwan
关键词
light sensitivity; ISFET; carrier generation; tin oxide; pH sensitivity;
D O I
10.1016/S0925-4005(99)00036-2
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
It is known that light sensitivity in ion sensitive field effect transistors (ISFETs) during illumination is due to carrier generation in the silicon substrate. In order to improve this drawback, multi-structure ISFETs: tin oxide/Al/insulator/Si ISFET devices are investigated in this study. In this structure, aluminum is used as a light shield, and the tin oxide is used as a pH sensitive layer. We have developed SnO2/Si3N4/SiO2/Si ISFETs and SnO2/Al/Si3N4/SiO2/Si ISFETs, respectively. The pH sensitivity of these devices was measured and the data shows that the SnO2/Al/S3N4/SiO2/Si ISFET sensors have a linear pH response of about 56-58 mV/pH in a concentration range between pH2 and pH10 under room light conditions. Subsequently, the light sensitivity of the ISFETs with/without aluminum as a light shield were investigated under 2000 lx white light exposure. The data show that ISFETs with aluminum as a light shield have low light sensitivity compared with ISFETs without aluminum as a light shield. (C) 1999 Elsevier Science S.A. All rights reserved.
引用
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页码:1 / 5
页数:5
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