Reliability analysis of 4 in field-emission display

被引：4

作者：

Kim, JM ^{[1
]}

Hong, JP ^{[1
]}

Kim, JW ^{[1
]}

Choi, JH ^{[1
]}

Park, NS ^{[1
]}

Kang, JH ^{[1
]}

Jang, JE ^{[1
]}

Ryu, YS ^{[1
]}

Yang, HC ^{[1
]}

机构：

[1] VOLGA R&D INST,SARATOV 410052,RUSSIA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1997年 / 15卷 / 02期

关键词：

D O I：

10.1116/1.589286

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

4 in field-emission display (FED) devices have been constructed and analyzed utilizing Spinelt-type cathodes, uniquely developed low-voltage phosphors and spacers. The cathode was especially fabricated without using a resistive layer. The reliability and the feasibility of the FED device have been tested both in a vacuum chamber and in a fully sealed condition. The electrical aging effect on microtip emission properties were carried out, which resulted in significant enhancement in electrical characteristics of the FED device. The fully sealed FED device was analyzed as a function of lifetime. Additionally, the characteristics of the phosphor and the spacer used in our FED device are discussed. (C) 1997 American Vacuum Society.

引用

页码：528 / 532

页数：5

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