Nanoscale roughness of oxide glass surfaces

被引:49
作者
Gupta, PK
Inniss, D
Kurkjian, CR
Zhong, Q
机构
[1] Ohio State Univ, Dept Mat Sci & Engn, Columbus, OH 43210 USA
[2] Lucent Technol, Norcross, GA 30071 USA
[3] Rutgers State Univ, Dept Ceram, Piscataway, NJ 08854 USA
[4] Tyco Submarine Syst, Holmdel, NJ 07733 USA
基金
美国国家航空航天局;
关键词
D O I
10.1016/S0022-3093(99)00662-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A comparative atomic force microscopy (AFM) study of melt-formed and fracture surfaces of silica and E-glass is reported. It is proposed that the minimum observed nanoscale roughness of a pristine melt-formed surface is controlled by the surface tension of the melt at the glass transition temperature and that the minimum observed nanoscale roughness observed in the mirror region of a fracture surface reflects the intrinsic inhomogeneities in the structure of the glass. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:200 / 206
页数:7
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