In situ characterization of colloidal spheres by synchrotron small-angle x-ray scattering

被引:50
作者
Megens, M
vanKats, CM
Bosecke, P
Vos, WL
机构
[1] UNIV AMSTERDAM, VAN DER WAALS ZEEMAN INST, NL-1018 XE AMSTERDAM, NETHERLANDS
[2] EUROPEAN SYNCHROTRON RADIAT FACIL, F-38043 GRENOBLE, FRANCE
关键词
D O I
10.1021/la970422v
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We have performed small-angle X-ray scattering with a synchrotron source on dilute suspensions of colloidal spheres of polystyrene latex, Stober silica, and microemulsion-grown silica, Many interference fringes are observed of the monodisperse particles over a large range of scattering vectors and more than 5 orders of magnitude in intensity. We present a straightforward method to deduce the radii, the size polydispersity, and the interface thickness of the particles from a Pored plot of one and the same in situ measurement. The radii agree very well with static light-scattering data. The radii are larger than the electron microscopy data of dry spheres and smaller than the hydrodynamic radii from dynamic lightscattering data. The size polydispersities are smaller than those obtained by electron microscopy, which is well explained by the intrinsic random errors of electron microscopy. We find that nearly all the particles have a homogeneous internal density and a sharp interface with the suspending medium of less than 1 nm wide. In one case of a stepwise synthesized particle, we have discerned a dense core and a less-dense shell, without contrast matching with the suspending liquid. It is concluded that synchrotron small-angle X-ray scattering is a very powerful technique for the in situ study of colloidal systems.
引用
收藏
页码:6120 / 6129
页数:10
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