Numerical study of the effects of reactor geometry on a chlorine plasma helicon etch reactor

被引:14
作者
Font, GI
Boyd, ID
机构
[1] Sibley Sch. Mech. and Aerosp. Eng., Cornell University, Ithaca
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1997年 / 15卷 / 02期
关键词
D O I
10.1116/1.580486
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The flow field inside a helicon plasma etch reactor is simulated using a direct simulation Monte Carlo method for a chlorine feed gas flow. Computations for the gas discharge are carried out modeling the ions and neutrals as particles and imposing the electrons as a background condition conforming to experimental measurements. The neutrals and ions are then allowed to interact with the background electrons and relax to a steady state. The resulting plasma is primarily composed of chlorine atoms and ions. The plasma flow is compared for three separate nozzle locations. The flow field, in the presence of the plasma, is found to be affected minimally by the nozzle location. A nozzle location is identified which maximizes flux to the wafer. (C) 1997 American Vacuum Society.
引用
收藏
页码:313 / 319
页数:7
相关论文
共 19 条
[1]   A 2-DIMENSIONAL PARTICLE-IN-CELL SIMULATION OF AN ELECTRON-CYCLOTRON-RESONANCE ETCHING TOOL [J].
ASHTIANI, KA ;
SHOHET, JL ;
HITCHON, WNG ;
KIM, GH ;
HERSHKOWITZ, N .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (04) :2270-2278
[2]  
Bird G. A., 1994, MOL GAS DYNAMICS DIR
[3]   PARTICLE-IN-CELL CHARGED-PARTICLE SIMULATIONS, PLUS MONTE-CARLO COLLISIONS WITH NEUTRAL ATOMS, PIC-MCC [J].
BIRDSALL, CK .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1991, 19 (02) :65-85
[4]   Scalar and parallel optimized implementation of the direct simulation Monte Carlo method [J].
Dietrich, S ;
Boyd, ID .
JOURNAL OF COMPUTATIONAL PHYSICS, 1996, 126 (02) :328-342
[5]   2-DIMENSIONAL DIRECT SIMULATION MONTE-CARLO (DSMC) OF REACTIVE NEUTRAL AND ION FLOW IN A HIGH-DENSITY PLASMA REACTOR [J].
ECONOMOU, DJ ;
BARTEL, TJ ;
WISE, RS ;
LYMBEROPOULOS, DP .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1995, 23 (04) :581-590
[6]  
GIBSON G, 1995, COMMUNICATION
[7]   THE ROLE OF THE PLASMA IN THE CHEMISTRY OF LOW-PRESSURE PLASMA ETCHERS [J].
HARVEY, REP ;
HITCHON, WNG ;
PARKER, GJ .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 1995, 23 (03) :436-452
[8]   ABSOLUTE ELECTRON-IMPACT-IONIZATION CROSS-SECTION MEASUREMENTS OF THE HALOGEN ATOMS [J].
HAYES, TR ;
WETZEL, RC ;
FREUND, RS .
PHYSICAL REVIEW A, 1987, 35 (02) :578-584
[9]   ELECTRON-CHLORINE MOLECULE TOTAL IONIZATION AND ELECTRON-ATTACHMENT CROSS-SECTIONS [J].
KUREPA, MV ;
BELIC, DS .
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS, 1978, 11 (21) :3719-3729
[10]   GLOBAL-MODEL OF AR, O-2, CL-2, AND AR/O-2 HIGH-DENSITY PLASMA DISCHARGES [J].
LEE, C ;
LIEBERMAN, MA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1995, 13 (02) :368-380