Dislocation mechanisms and symmetric slip in rolled nano-scale metallic multilayers

被引：132

作者：

Misra, A ^{[1
]}

Hirth, JP ^{[1
]}

Hoagland, RG ^{[1
]}

Embury, JD ^{[1
]}

Kung, H ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Div Mat Sci & Technol, Los Alamos, NM 87545 USA

来源：

ACTA MATERIALIA | 2004年 / 52卷 / 08期

关键词：

rolling; metallic multilayers; dislocation substructures; texture; sputter deposition;

D O I：

10.1016/j.actamat.2004.01.029

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Self-supported Cu-Nb multilayered foils, synthesized by sputter deposition, show significantly different deformation behavior during rolling when the as-deposited individual layer thickness is in the few tens of nanometers range as compared to the micrometer-scale. While the rolled micrometer-scale multilayers exhibit dislocation cell structure formation and large lattice rotations of the interface plane normal, the nano-scale multilayers reveal no dislocation cell structures and insignificant rotations of the interface normal. The observed behavior following large plastic strains is interpreted in terms of dislocation mechanisms of deformation in nano-scale laminates that result in symmetric slip. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：2387 / 2394

页数：8

共 16 条

[1] Dislocation-based deformation mechanisms in metallic nanolaminates [J].

Anderson, PM ;

Foecke, T ;

Hazzledine, PM .

MRS BULLETIN, 1999, 24 (02) :27-33

[2] Rolling textures in nanoscale Cu/Nb multilayers [J].

Anderson, PM ;

Bingert, JF ;

Misra, A ;

Hirth, JP .

ACTA MATERIALIA, 2003, 51 (20) :6059-6075

[3]

[Anonymous], THEORY DISLOCATIONS

[4] Structure and strength of multilayers [J].

Clemens, BM ;

Kung, H ;

Barnett, SA .

MRS BULLETIN, 1999, 24 (02) :20-26

[5] ON DISLOCATION STORAGE AND THE MECHANICAL RESPONSE OF FINE-SCALE MICROSTRUCTURES [J].

EMBURY, JD ;

HIRTH, JP .

ACTA METALLURGICA ET MATERIALIA, 1994, 42 (06) :2051-2056

[6] On the strengthening effects of interfaces in multilayer fcc metallic composites [J].

Hoagland, RG ;

Mitchell, TE ;

Hirth, JP ;

Kung, H .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 2002, 82 (04) :643-664

[7] Tensile testing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers [J].

Huang, HB ;

Spaepen, F .

ACTA MATERIALIA, 2000, 48 (12) :3261-3269

[8] Transmission electron microscopy observations of deformation and fracture in nanolaminated Cu-Ni thin films [J].

Kramer, DE ;

Foecke, T .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 2002, 82 (17-18) :3375-3381

[9] Damage mechanisms in nanolayered metallic composites [J].

Misra, A ;

Kung, H ;

Hammon, D ;

Hoagland, RG ;

Nastasi, M .

INTERNATIONAL JOURNAL OF DAMAGE MECHANICS, 2003, 12 (04) :365-376

[10] Single-dislocation-based strengthening mechanisms in nanoscale metallic multilayers [J].

Misra, A ;

Hirth, JP ;

Kung, H .

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 2002, 82 (16) :2935-2951

← 1 2 →