Molecular structure of C(GeBr3)(4) determined by gas-phase electron diffraction and density functional theory calculations: Implications for the length and stability of Ge-C bonds in crystalline semiconductor solids

被引:7
作者
Haaland, A
Shorokhov, DJ
Strand, TG
Kouvetakis, J
OKeeffe, M
机构
[1] UNIV OSLO,DEPT CHEM,N-0315 OSLO,NORWAY
[2] ARIZONA STATE UNIV,DEPT CHEM,TEMPE,AZ 85287
关键词
D O I
10.1021/ic970582u
中图分类号
O61 [无机化学];
学科分类号
070301 ; 081704 ;
摘要
The structure of C(GeBr3)(4) has been determined by gas-phase electron diffraction. It has a C-Ge bond length of 2.042(8) Angstrom (about 0.1 Angstrom longer than normal), and the 12 Br atom positions are close to the vertices of a regular icosahedron. Density functional calculations closely reproduce the observed structure. The implications of the observed structure for bond lengths in Ge-C crystals and related electronic materials based on the diamond structure are discussed.
引用
收藏
页码:5198 / 5201
页数:4
相关论文
共 35 条
[1]   THE MOLECULAR-STRUCTURE OF TETRAKIS(TRIMETHYLSILYL)METHANE STUDIED BY GAS-PHASE ELECTRON-DIFFRACTION AND MOLECULAR MECHANICS [J].
BEAGLEY, B ;
PRITCHARD, RG ;
TITILOYE, JO .
JOURNAL OF MOLECULAR STRUCTURE, 1988, 176 :81-87
[2]   ON THE T SYMMETRY OF THE MOLECULE TETRAKIS(TRIMETHYLSILYL)METHANE IN THE GAS-PHASE [J].
BEAGLEY, B ;
PRITCHARD, RG ;
TITILOYE, JO .
JOURNAL OF MOLECULAR STRUCTURE, 1989, 212 :323-324
[3]   MOLECULAR-STRUCTURES OF GEH2CL2 AND GEH2BR2 BY GAS-PHASE ELECTRON-DIFFRACTION [J].
BEAGLEY, B ;
BROWN, DP ;
FREEMAN, JM .
JOURNAL OF MOLECULAR STRUCTURE, 1973, 18 (02) :335-336
[4]   DENSITY-FUNCTIONAL EXCHANGE-ENERGY APPROXIMATION WITH CORRECT ASYMPTOTIC-BEHAVIOR [J].
BECKE, AD .
PHYSICAL REVIEW A, 1988, 38 (06) :3098-3100
[5]  
BERDLING MA, IN PRESS PHYS REV B
[6]  
BONHAM RA, 1974, INT TABLES XRAY CRYS, V4
[7]   SPECTRA AND STRUCTURE OF ORGANOGERMANES .15. MICROWAVE-SPECTRUM OF TRIMETHYLGERMANE [J].
DURIG, JR ;
CHEN, MM ;
LI, YS ;
TURNER, JB .
JOURNAL OF PHYSICAL CHEMISTRY, 1973, 77 (02) :227-229
[8]  
Frisch M.J., 1995, GAUSSIAN 94
[9]  
*GMEL I AN CHEM, 1996, IN CRYST STRUCT DAT
[10]   A commercial scanner applied as a microdensitometer for gas electron-diffraction photographic plates [J].
Gundersen, S ;
Strand, TG .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1996, 29 (pt 6) :638-645