Characterisation of SnOx films on architectural glass by neutron reflectometry, SIMS, CEMS and spectrophotometry

被引:10
作者
Caccavale, F
Coppola, R
Menelle, A
Montecchi, M
Polato, P
Principi, G
机构
[1] STN SPERIMENTALE VETRO,I-30141 MURANO,ITALY
[2] UNIV PADUA,DIPARTIMENTO FIS,INFM,I-35131 PADUA,ITALY
[3] ENEA CASACCIA,IN,FIS,DIAF,I-00060 ROME,ITALY
[4] CTR ETUD SACLAY,LAB LEON BRILLOUIN,F-91191 GIF SUR YVETTE,FRANCE
[5] ENEA CASACCIA,THIN FILM OPT LAB,I-00060 ROME,ITALY
[6] UNIV PADUA,DIPARTIMENTO INGN MECCAN,INFM,I-35141 PADUA,ITALY
关键词
D O I
10.1016/S0022-3093(97)00203-2
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this paper the optical properties of tin oxide and tin-oxide/silicon-oxide coatings of some commercial flat glasses were measured. These on-line coatings were deposited between forming and annealing of the moving float glass ribbon by atmospheric-pressure chemical vapour deposition with the substrate at a temperature of 600 degrees C. The optical properties of the coatings were related to their chemical, structural and compositional characteristics by using several complementary analytical techniques. The stoichiometry of the coatings and their crystallinity were analysed by conversion electron Mossbauer spectroscopy. The thicknesses and compositional profiles of the single and double layers of the coatings were determined by secondary ion mass spectrometry. Neutron reflectometry confirmed the thicknesses of the thinner coatings while this technique cannot be applied in the case of tin oxide layers thicker than 500 nm. (C) 1997 Elsevier Science B.V.
引用
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页码:291 / 295
页数:5
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