Disordered matter under extreme conditions: X-ray diffraction, electron spectroscopy and electroresistance measurements

被引:14
作者
Di Cicco, Andrea
Gunnella, Roberto
Marassi, Roberto
Minicucci, Marco
Natali, Riccardo
Pratesi, Gabriele
Principi, Emiliano
Stizza, Sergio
机构
[1] Univ Camerino, Dipartimento Fis, CNISM, CNR INFM, I-62032 Camerino, MC, Italy
[2] Univ Camerino, Dipartimento Chim, I-62032 Camerino, MC, Italy
[3] Univ Camerino, Ctr Inerdiparimentale Grandi Apparecchiature, I-62032 Camerino, MC, Italy
关键词
X-ray diffraction; surface and interfaces; pressure effects;
D O I
10.1016/j.jnoncrysol.2006.07.040
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In the last decade, we have developed a set of experimental techniques for in-house X-ray diffraction measurements under high-temperature (up to about 2300 K) and high-pressure (up to 10 GPa and 1500 K, up to 100 GPa and 700 K) conditions, electron energy-loss and Auger measurements for surface electronic structure measurements at high-temperature (up to about 1800 K), and electrical resistance measurements covering both low-temperatures (2 K) and high-temperatures/high-pressures (1500 K, 7 GPa) conditions. In this paper we discuss some important technical features and possibilities of these new equipments and present novel data collected for phase transitions and structural modifications occurring in liquid and solid systems. In particular, we present new results about phase transitions and undercooling of bismuth under pressure, extreme undercooling and metastable states in gallium films, and surface phase transitions of Si at high-temperatures. The relevance of these experiments to the exploitation of the potential of equipments available at synchrotron radiation facilities is emphasized. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:4155 / 4165
页数:11
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