Dielectric properties and relaxation in (1-x)BiScO3-xBa(Mg1/3Nb2/3)O3 solid solutions

被引:13
作者
Kwon, DK [1 ]
Randall, CA [1 ]
Shrout, TR [1 ]
Lanagan, MT [1 ]
机构
[1] Penn State Univ, Mat Res Inst, Ctr Dielect Studies, University Pk, PA 16802 USA
关键词
D O I
10.1111/j.1551-2916.2004.01088.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The dielectric properties and frequency dispersion associated with a dielectric relaxation were evaluated within the perovskite (1-x)BiScO3-xBa(Mg1/3Nb2/3)O-3 solid solution systems (0.7 less than or equal to x less than or equal to 1). With increasing BiScO3, the room-temperature dielectric permittivity at low frequency (100 Hz) increased up to 115 at x = 0.7, and a dielectric relaxation phenomenon was evident. Relaxation parameters were analyzed using several Arrhenius-type equations, and the microwave dielectric property measurement using rectangular wave-guide method enabled confirmation of the extrapolated value of the Arrhenius plot. The result of the microwave dielectric property measurement was also checked with J-function fitting based on the frequency-dependent Gaussian distribution of the associated dielectric loss data at low frequency.
引用
收藏
页码:1088 / 1092
页数:5
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