ESEM imaging of polyfluorene blend cross-sections for organic devices

被引:28
作者
Ramsdale, CM [1 ]
Bache, IC [1 ]
MacKenzie, JD [1 ]
Thomas, DS [1 ]
Arias, AC [1 ]
Donald, AM [1 ]
Friend, RH [1 ]
Greenham, NC [1 ]
机构
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
关键词
ESEM; conjugated polymer; cross-section; organic devices; solar cells;
D O I
10.1016/S1386-9477(02)00392-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report the use of environmental scanning electron microscopy (ESEM) to determine the phase separation in the cross-section of a 200 nm thick polyfluorene blend film, of the type used in polymer photovoltaic devices and LEDs. The micron and sub-micron surface phases are found to penetrate through the film to the underlying substrate, whilst smaller surface features do not necessarily propagate through the film. The observed cross-sectional structure helps to explain the optoelectronic response of these blends and shows that ESEM is an effective tool in the characterisation of polymer blend cross-sections. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:268 / 271
页数:4
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