Carbon-nanotube probe equipped magnetic force microscope

被引：62

作者：

Arie, T ^{[1
]}

Nishijima, H ^{[1
]}

Akita, S ^{[1
]}

Nakayama, Y ^{[1
]}

机构：

[1] Univ Osaka Prefecture, Dept Phys & Elect, Sakai, Osaka 5998531, Japan

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 01期

关键词：

D O I：

10.1116/1.591159

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Metal capped carbon nanotubes, prepared by catalytic decomposition of benzene, have been applied as a magnetic force microscope tip. The particles at the end of nanotubes were about 35 nm in diameter, which were found to be Ni3C from the electron diffraction pattern. The other end of the nanotubes was attached on the rip of conventional Si probes. The magnetization of the particles was carried out parallel to the nanotube axis by applying a pulsed magnetic field of 12.5 T. We demonstrate the performance of these carbon nanotube probes by imaging the stored signal in magnetic recording media with magnetic force microscopy. (C) 2000 American Vacuum Society.

引用

页码：104 / 106

页数：3

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