Simple theory of the line emission profile for the charge-exchange recombination spectroscopy method

被引：5

作者：

Ryutov, DD ^{[1
]}

机构：

[1] Lawrence Livermore Natl Lab, Livermore, CA 94551 USA

来源：

PHYSICS OF PLASMAS | 2000年 / 7卷 / 04期

关键词：

D O I：

10.1063/1.873949

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

A systematic derivation of the distribution function of excited ions formed by charge-exchange recombination is presented. The following effects have been taken into account: (1) Finite lifetime of the excited state; (2) energy dependence of the charge-exchange reactivity; (3) nonuniformity of the neutral beam. It is pointed out that the contribution of the terms related to the ion temperature gradient has a different structure compared to the other terms, thereby allowing a direct measurement of the ion temperature gradient. Possible ways for improving the accuracy of electric field measurements are discussed. [S1070-664X(00)01404-X].

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页码：1315 / 1320

页数：6

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