Ultraviolet electroluminescence in GaN/AlGaN single-heterojunction light-emitting diodes grown on Si(111)

被引:25
作者
Sánchez-García, MA [1 ]
Naranjo, FB [1 ]
Pau, JL [1 ]
Jiménez, A [1 ]
Calleja, E [1 ]
Muñoz, E [1 ]
机构
[1] UPM, ETSI Telecommun, Dept Ingn Elect, Madrid 28040, Spain
关键词
D O I
10.1063/1.372052
中图分类号
O59 [应用物理学];
学科分类号
摘要
GaN:Mg/AlGaN single-heterojunction light-emitting diodes were grown on Si(111) substrates by plasma-assisted molecular-beam epitaxy. High-quality Mg-doped GaN layers with hole concentrations up to 1.2 x 10(17) holes/cm(3) and intense low-temperature photoluminescence, which increases in annealed samples, were obtained. Smooth AlGaN layers, with surface roughness below 5 nm, were used as buffer layers. Continuous-wave room-temperature ultraviolet electroluminescence was observed at 365 nm with a full width at half maximum of 8 nm. An estimated optical power output of 1.5 mu W was achieved under 15 V/35 mA operation. (C) 2000 American Institute of Physics. [S0021-8979(00)02803-6].
引用
收藏
页码:1569 / 1571
页数:3
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