Radiation damage studies of a recycling integrator VLSI chip for dosimetry and control of therapeutical beams

被引:10
作者
Cirio, R
Bourhaleb, F
Degiorgis, PG
Donetti, M
Marchetto, F
Marletti, M
Mazza, G
Peroni, C
Rizzi, E
SanzFreire, C
机构
[1] Univ Turin, Dipartimento Fis Sperimentale, I-10125 Turin, Italy
[2] Ist Nazl Fis Nucl, I-10125 Turin, Italy
[3] Univ Mohamed 1, Fac Sci, Oujda, Morocco
[4] Fdn TERA, I-28100 Novara, Italy
[5] Osserv Astron Torino, I-10025 Pino Torinese, Italy
关键词
radiation damage; VLSI electronics; dosimetry; conformal radiotherapy; hadrontherapy;
D O I
10.1016/S0168-9002(01)01682-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A VLSI chip based on a recycling integrator has been designed and built to be used as front-end readout of detectors for dosimetry and beam monitoring. The chip is suitable for measurements with both conventional radiotherapy accelerators (photon or electron beams) and with hadron accelerators (proton or light ion beams). As the chips might be located at few centimeters from the irradiation area and they are meant to be used in routine hospital practice, it is mandatory to assert their damage to both electromagnetic and neutron irradiation. We have tested a few chips on a X-ray beam and on thermal and fast neutron beams. Results of the tests are reported and an estimate of the expected lifetime of the chip for routine use is given. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:752 / 760
页数:9
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