Ultra high dielectric constant epoxy silver composite for embedded capacitor application

被引:57
作者
Rao, Y [1 ]
Wong, CP [1 ]
机构
[1] Georgia Inst Technol, Package Res Ctr, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
来源
52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS | 2002年
关键词
D O I
10.1109/ECTC.2002.1008210
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Embedded capacitor technology can increase silicon packaging efficiency, improve electrical performance, and reduce electronic assembly cost compared with traditional discrete, capacitor technology. Developing a suitable material that satisfies electrical, reliability and processing requirements is one of the major challenges of incorporating capacitors into a printed wiring board (PWB) for demanding wireless, RF portable telecommunication products. A novel epoxy-based composite with very ultra high dielectric constant (epsilon(r)similar to1000) has been developed in this work. The previous record of Er =150 was only recently reported. To our best knowledge, this is the highest K value of the polymer-based composite ever reported. High dielectric constant is obtained by increasing the concentration of conductive filler close to but not exceed the percolation threshold within the polymer matrix. This novel ultra high K material also has low dielectric loss (< 0.02), good adhesion and perfect multi-chip-module laminate (MCM-L) process compatibility. This novel composite is the perfect material candidate for the integral embedded capacitor applications for next generation electronic products.
引用
收藏
页码:920 / 923
页数:2
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