Computer vision based system for apple surface defect detection

被引：140

作者：

Li, QZ

Wang, MH ^{[1
]}

Gu, WK

机构：

[1] China Agr Univ, Res Ctr Precis Agr, Beijing, Peoples R China

[2] Zhejiang Univ, Dept Informat & Elect Engn, Hangzhou 310027, Peoples R China

来源：

COMPUTERS AND ELECTRONICS IN AGRICULTURE | 2002年 / 36卷 / 2-3期

关键词：

machine vision; apple; surface defect;

D O I：

10.1016/S0168-1699(02)00093-5

中图分类号：

S [农业科学];

学科分类号：

09 ;

摘要：

A novel automated apple surface defect sorting experimental system based on computer image technology has been developed. The hardware system has the advantage of being able to inspect simultaneously four sides of each apple on the sorting line. The methods, including image background removal, defects segmentation and identification for stem-end and calyx areas, were developed. The results show that the experimental hardware system is practical and feasible, and that the proposed algorithm of defect detection is effective. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：215 / 223

页数：9