Validation of the measurement model concept for error structure identification

被引:23
作者
Shukla, PK [1 ]
Orazem, ME [1 ]
Crisalle, OD [1 ]
机构
[1] Univ Florida, Dept Chem Engn, Gainesville, FL 32611 USA
关键词
measurement model; regression; impedance; admittance; immittance;
D O I
10.1016/j.electacta.2004.01.047
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The development of different forms of measurement models for impedance has allowed examination of key assumptions on which the use of such models to assess error structure are based. The stochastic error structures obtained using the transfer-function and Voigt measurement models were identical, even when non-stationary phenomena caused some of the data to be inconsistent with the Kramers-Kronig relations. The suitability of the measurement model for assessment of consistency with the Kramers-Kronig relations, however, was found to be more sensitive to the confidence interval for the parameter estimates than to the number of parameters in the model. A tighter confidence interval was obtained for Voigt measurement model, which made the Voigt measurement model a more sensitive tool for identification of inconsistencies with the Kramers-Kronig relations. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2881 / 2889
页数:9
相关论文
共 17 条
[1]   MEASUREMENT MODELS FOR ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY .1. DEMONSTRATION OF APPLICABILITY [J].
AGARWAL, P ;
ORAZEM, ME ;
GARCIARUBIO, LH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (07) :1917-1927
[2]   Application of measurement models to impedance spectroscopy .2. Determination of the stochastic contribution to the error structure [J].
Agarwal, P ;
Crisalle, OD ;
Orazem, ME ;
GarciaRubio, LH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (12) :4149-4158
[3]   Application of measurement models to impedance spectroscopy .3. Evaluation of consistency with the Kramers-Kronig relations [J].
Agarwal, P ;
Orazem, ME ;
GarciaRubio, LH .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (12) :4159-4168
[4]   A LINEAR KRONIG-KRAMERS TRANSFORM TEST FOR IMMITTANCE DATA VALIDATION [J].
BOUKAMP, BA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (06) :1885-1894
[5]   ALTERNATIVES TO KRONIG-KRAMERS TRANSFORMATION AND TESTING, AND ESTIMATION OF DISTRIBUTIONS [J].
BOUKAMP, BA ;
MACDONALD, JR .
SOLID STATE IONICS, 1994, 74 (1-2) :85-101
[6]  
Box G, 1987, EMPIRICAL MODEL BUIL
[7]  
BRACHMAN MK, 1956, PHYSICA, V20, P141
[8]   On the error structure of impedance measurements -: Simulation of FRA instrumentation [J].
Carson, SL ;
Orazem, ME ;
Crisalle, OD ;
García-Rubio, L .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2003, 150 (10) :E477-E490
[9]   CLASSICAL THEORY OF OPTICAL DISPERSION [J].
CHRISTY, RW .
AMERICAN JOURNAL OF PHYSICS, 1972, 40 (10) :1403-&
[10]  
JUTAN A, 1993, PROCESS CONTR QUAL, V4, P235