Conductance measurements of nanoscale regions with in situ transmission electron microscopy

被引：3

作者：

Arita, Masashi ^{[1
]}

Hirose, Ryusuke

Hamada, Kouichi

Takahashi, Yasuo

机构：

[1] Hokkaido Univ, Grad Sch Informat Sci & Technol, Sapporo, Hokkaido 0600814, Japan

[2] Hokkaido Univ, Grad Sch Engn, Sapporo, Hokkaido 0600813, Japan

来源：

MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS | 2006年 / 26卷 / 5-7期

基金：

日本学术振兴会;

关键词：

transmission electron microscopy; scanning tunnelling spectroscopy; SrF2; Fe-SrF2 granular film; Coulomb staircase;

D O I：

10.1016/j.msec.2005.09.029

中图分类号：

T [工业技术];

学科分类号：

08 [工学];

摘要：

Conductance measurements of nanostructures with simultaneous transmission electron microscopy (TEM) were performed on thin insulating SrF2 films (3 nm thick) and Fe-SrF2 granular films (10 nm thick) deposited on tip-shaped An electrodes. By using a movable counter electrode, nanoscale regions were selected for investigation. Systematic measurements taken during the deformation of the SrF2, film by the counter-electrode provided a tunnelling barrier height of about 2.5 eV The conductance of Fe-SrF2 in nanoscale (similar to 500 nm(2)) showed the Coulomb staircase like characteristics at room temperature. The staircase period approximately corresponded to the value estimated from the geometry observed by TEM. The feasibility of this method is briefly described. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：776 / 781

页数：6

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