Electronic structure investigations of Ni and Cr films on (100)SrTiO3 substrates using electron energy-loss spectroscopy

被引：20

作者：

van Benthem, K ^{[1
]}

Scheu, C ^{[1
]}

Sigle, W ^{[1
]}

Rühle, M ^{[1
]}

机构：

[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany

来源：

ZEITSCHRIFT FUR METALLKUNDE | 2002年 / 93卷 / 05期

关键词：

electron energy-loss spectroscopy (EELS); electron energy-loss near-edge structures (ELNES); electronic structure; metal/ceramic interfaces; thin films;

D O I：

10.3139/146.020362

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

Metal/ceramic interfaces between thin nickel and chromium films and the TiO2 terminated (100) surface of SrTiO3 were studied by various transmission electron microscopy techniques to investigate the bonding behaviour between film and substrate. For the Ni/SrTiO3 interface, a semi-coherent interface structure between three-dimensionally grown Ni islands and the SrTiO3 substrate was observed. From electron energy-loss spectroscopy measurements and high-resolution transmission electron microscopy studies, the formation of a two-dimensional NiO layer at the interface was concluded, which dominates the adhesion between the Ni film and the ceramic substrate. At the Cr/SrTiO3 interface, Cr-O bonds were found, possessing an ionic-bonding contribution. Comparing the bonding characteristics of Ni and Cr on the (100) surface of SrTiO3, a stronger adhesion of Cr than for Ni is proposed.

引用

页码：362 / 371

页数：10

共 62 条

[1] NONDIPOLE CHANNELS IN THE ELECTRON-ENERGY-LOSS STRUCTURE NEAR THE 3S EDGE OF COPPER [J].