Mossbauer effect and X-ray diffraction investigation of Si-Fe thin films

被引:17
作者
McGraw, J. D.
Fleischauer, M. D.
Dahn, J. R.
Dunlap, R. A. [1 ]
机构
[1] Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada
[2] Dalhousie Univ, Dept Chem, Halifax, NS B3H 3J5, Canada
[3] Dalhousie Univ, Mat Res Inst, Halifax, NS B3H 3J5, Canada
基金
加拿大创新基金会; 加拿大自然科学与工程研究理事会;
关键词
D O I
10.1080/14786430600764864
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An X-ray diffraction and 57 Fe Mossbauer spectroscopy investigation of Si100-xFex(0 < x < 80) thin films prepared by combinatorial sputtering methods is reported. Resulting Mossbauer spectra were fit to Voigt-based distributions of quadrupole doublets for paramagnetic spectral components and Zeeman split sextets for ferromagnetic spectral components. In conjunction with the X-ray measurements, these results show that the Si- rich films are a mixture of dilute Fe in amorphous Si and an approximately equiatomic amorphous SiFe phase. Fe-rich films show the presence of a ferromagnetically ordered phase. For x < 73, this ferromagnetic phase is amorphous or nanostructured and for x >= 73, the phase is shown to be a crystalline bcc phase. Results are discussed in terms of short-range structural ordering in these alloys.
引用
收藏
页码:5017 / 5030
页数:14
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