Resonant trapping: A failure mechanism in switch transitions

被引：77

作者：

Apostolico, F

Gammaitoni, L

Marchesoni, F

Santucci, S

机构：

[1] IST NAZL FIS NUCL,VIRGO PROJECT,I-06100 PERUGIA,ITALY

[2] UNIV ILLINOIS,DEPT PHYS,URBANA,IL 61801

来源：

PHYSICAL REVIEW E | 1997年 / 55卷 / 01期

关键词：

D O I：

10.1103/PhysRevE.55.36

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Stochastic resonance in a time-modulated bistable system is shown to survive at modulation amplitudes larger than the relevant dynamical bistability threshold. Residual stochastic resonance is related to a synchronization-loss mechanism (resonant trapping), which attains its maximum effect for noise-intensities proportional to the excess modulation amplitude. Such a phenomenon provides an effective model of noise-induced failures in switch devices.

引用

页码：36 / 39

页数：4

共 21 条

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