Diffusion study of multi-organic layers in OLEDs by ToF-SIMS

被引:14
作者
Chen, Wen-Yin [1 ]
Ling, Yong-Chien [1 ]
Chen, Bo-Jung [1 ]
Shih, Hung-Hsin [1 ]
Cheng, Chien-Hong [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Chem, Hsinchu 30013, Taiwan
关键词
OLEDs; diffusion; interface; heat treatment; ToF-SIMS; LIGHT-EMITTING DEVICES; INTERFACE;
D O I
10.1016/j.apsusc.2006.02.228
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A model organic light-emitting diodes (OLEDs) with structure of tris(8-hydroxyquinoline) aluminum (Alq(3))/N,N'-diphenyl-N,N'-bis[1-naphthy-(1,1'-diphenyl)]-4,4'-diamine (N-PB)/indium tin oxide (ITO)-coated glass was fabricated for diffusion study by ToF-SIMS. The results demonstrate that ToF-SIMS is capable of delineating the structure of multi-organic layers in OLEDs and providing specific molecular information to aid deciphering the diffusion phenomena. Upon heat treatment, the solidity or hardness of the device was reduced. Complicated chemical reaction might occur at the NPB/ITO interface and results in the formation of a buffer layer, which terminates the upper diffusion of ions from underlying ITO. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:6594 / 6596
页数:3
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