Stray fields of domains in permalloy microstructures - Measurements and simulations

We have measured the stray fields of thin permalloy (Ni83Fe17) microstructures with different geometries and several thicknesses by magnetic-force microscopy (MFM). The MFM images are compared to corresponding images calculated from micromagnetic simulations. In particular, the type of 180degrees domain walls is discussed. We observe a transition from cross-tie to asymmetric Bloch walls between 70 and 100 nm film thickness. Good agreement between measurement and simulation is obtained. (C) 2004 American Institute of Physics.