Transmission electron microscopy study of dislocations and extended defects in as-grown icosahedral Al-Pd-Mn single grains

被引：56

作者：

Caillard, D

Vanderschaeve, G

Bresson, L

Gratias, D

机构：

[1] CNRS, Ctr Elaborat Mat & Etud Struct, F-31055 Toulouse, France

[2] CNRS, Ctr Etud Chim Met, F-94407 Vitry, France

[3] Off Natl Etud & Rech Aerosp, CNRS, Lab Etud Microstruct, F-92322 Chatillon, France

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 2000年 / 80卷 / 01期

关键词：

D O I：

10.1080/01418610008212051

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Analyses of transmission electron microscopy observations of dislocations and faults oriented in mirror planes of as-grown single grains of icosahedral Al-Pd-Mn show that the Burgers vectors and associated fault vectors are perpendicular to the fault planes. These results suggest that climb processes have to be considered as realistic deformation modes at high temperatures in these materials.

引用

页码：237 / 253

页数：17

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