X-ray diffraction study of α-(BEDT-TTF)2I3 single crystal under high pressure

被引:12
作者
Tamura, I [1 ]
Kobayashi, H
Kobayashi, A
机构
[1] Inst Mol Sci, Okazaki, Aichi 4448585, Japan
[2] Univ Tokyo, Grad Sch Sci, Res Ctr Spectrochem, Bunkyo Ku, Tokyo 1130033, Japan
关键词
X-ray diffraction; crystal structure;
D O I
10.1016/S0022-3697(02)00050-1
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
alpha-(BEDT-TTF)(2)I-3 (alpha-ET2I3) is one of the well-known organic conductors, which undergoes a metal-insulator transition around 135 K at 1 atm. This metal-insulator transition can be suppressed by applying pressure. Recently, the transport property of alpha-ET2I3 under high pressure attracts many interests because of its peculiar behaviors. In order to investigate the origin of the peculiar transport property from the structural point of view, we performed X-ray structure analyses of alpha-ET2I3 single crystal under several pressures using diamond anvil cell at room temperature. The crystal structure was refined by usual least-square method. The rigid body approximation of ET molecules was not adopted. The lattice parameters and the I-I bond lengths of the I-3(-) anions decrease with increasing pressure. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1255 / 1257
页数:3
相关论文
共 6 条
[1]   MAGNETOTRANSPORT PHENOMENA OF ALPHA-TYPE (BEDT-TTF)2I3 UNDER HIGH-PRESSURES [J].
KAJITA, K ;
OJIRO, T ;
FUJII, H ;
NISHIO, Y ;
KOBAYASHI, H ;
KOBAYASHI, A ;
KATO, R .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1992, 61 (01) :23-26
[2]  
KAJITA K, 1991, SYNTHETIC MET, V41, P2075
[3]  
MISHIMA T, 1995, SYNTHETIC MET, V69, P771
[4]  
OJIRO T, 1993, SYNTHETIC MET, V55, P2268
[5]   Processing of X-ray diffraction data collected in oscillation mode [J].
Otwinowski, Z ;
Minor, W .
MACROMOLECULAR CRYSTALLOGRAPHY, PT A, 1997, 276 :307-326
[6]   Transport property of an organic conductor α-(BEDT-TTF)2I3 under high pressure -: Discovery of a novel type of conductor [J].
Tajima, N ;
Tamura, M ;
Nishio, Y ;
Kajita, K ;
Iye, Y .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 2000, 69 (02) :543-551