Correlation between internal stress and ferroelectric fatigue in Bi4-xLaxTi3O12 thin films

被引：97

作者：

Lee, JK ^{[1
]}

Kim, CH ^{[1
]}

Suh, HS ^{[1
]}

Hong, KS ^{[1
]}

机构：

[1] Seoul Natl Univ, Seoul 151742, South Korea

来源：

APPLIED PHYSICS LETTERS | 2002年 / 80卷 / 19期

关键词：

D O I：

10.1063/1.1477272

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

La-substituted bismuth titanate [Bi4-xLaxTi3O12(BLT)] films were synthesized using pulsed-laser deposition and ferroelectric fatigue phenomenon was investigated. The internal strain present in the films, which was analyzed through the evaluation of the x-ray diffraction peak, was partially responsible for the fatigue in BLT films. When xgreater than or equal to0.75, the change in the internal strain was saturated and there was no significant degradation of switching charge, at least up to 10(10) cycles. It revealed that the internal strain, as well as chemical stability of oxygen ions, contributed to the ferroelectric fatigue of the BLT films. The origin of the internal strain is discussed in terms of the lattice mismatch between bulk materials and thin films. (C) 2002 American Institute of Physics.

引用

页码：3593 / 3595

页数：3

共 23 条

[1]

AlShareef HN, 1996, APPL PHYS LETT, V68, P690, DOI 10.1063/1.116593

[2] Fatigue-free behavior of highly oriented Bi3.25La0.75Ti3O12 thin films grown on Pt/Ti/SiO2/Si(100) by metalorganic solution decomposition [J].

Chon, U ;

Yi, GC ;

Jang, HM .

APPLIED PHYSICS LETTERS, 2001, 78 (05) :658-660

[3]

DEARAUJO CAP, 1995, NATURE, V374, P12

[4]

FATUZZO E, 1967, FERROELECTRICITY, P105

[5] INTERNAL FIELD THEORY OF HIGH PERMITTIVITY IN FINE-GRAINED BARIUM TITANATE [J].

GOSWAMI, AK ;

CROSS, LE ;

BUESSEM, WR .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1968, 24 (02) :279-&

[6] EFFECT OF COMPOSITION AND TEMPERATURE ON ELECTRIC FATIGUE OF LA-DOPED LEAD-ZIRCONATE-TITANATE CERAMICS [J].

JIANG, QY ;

SUBBARAO, EC ;

CROSS, LE .

JOURNAL OF APPLIED PHYSICS, 1994, 75 (11) :7433-7443

[7] X-ray-photoelectron spectroscopy study of Bi4Ti3O12 ferroelectric ceramics [J].

Jovalekic, C ;

Pavlovic, M ;

Osmokrovic, P ;

Atanasoska, L .

APPLIED PHYSICS LETTERS, 1998, 72 (09) :1051-1053

[8] MECHANICAL FATIGUE IN THIN-FILMS INDUCED BY PIEZOELECTRIC STRAINS AS A CAUSE OF FERROELECTRIC FATIGUE [J].

KHACHATURYAN, K .

JOURNAL OF APPLIED PHYSICS, 1995, 77 (12) :6449-6455

[9] Substrate temperature dependence of phase and orientation of pulsed laser deposited Bi-La-Ti-O thin films [J].

Kim, CH ;

Lee, JK ;

Suh, HS ;

Yi, JY ;

Hong, KS ;

Hahn, TS .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (3A) :1495-1499

[10] Correlation between strain and dielectric properties in ZrTiO4 thin films [J].

Kim, T ;

Oh, J ;

Park, B ;

Hong, KS .

APPLIED PHYSICS LETTERS, 2000, 76 (21) :3043-3045

← 1 2 3 →