In-plane alignment of para-sexiphenyl films grown on KCl(001)

被引：31

作者：

Smilgies, DM

Boudet, N

Yanagi, H

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

[2] Kobe Univ, Fac Engn, Nada Ku, Kobe, Hyogo 6578501, Japan

来源：

APPLIED SURFACE SCIENCE | 2002年 / 189卷 / 1-2期

关键词：

organic substances; molecular electronics; structural properties; surface X-ray diffraction;

D O I：

10.1016/S0169-4332(01)01029-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The three-dimensional growth of para-sexiphenyl (p-6P) on KCl(001) is characterized by a large polymorphism. Using grazing-incidence diffraction, we have found that two of the known five orientational phases feature preferential in-plane alignments along the [110] in-plane direction of the substrate: p-6P(11-1) parallel to KCl(001) with [1 - 10] parallel to KCl[110] as well as p-6P(001) parallel to KCl(001) with [1 -10] parallel to KCl[110]. The latter structure is a peculiar low-symmetry configuration, which can be understood by analysis of the molecular crystal lattice and the substrate symmetry. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：24 / 30

页数：7

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