Application of X-ray mask fabrication technologies to high resolution, large diameter Ta Fresnel zone plates

被引:44
作者
Ozawa, A
Tamamura, T
Ishii, T
Yoshihara, H
Kagoshima, T
机构
[1] NTT Advanced Technology Corporation, Atsugi-shi, Kanagawa 243-01, 3-1, Morinosato Wakamiya
[2] NTT Opto-electronics Laboratories, Atsugi-shi, Kanagawa 243-01, 3-1, Morinosato Wakamiya
[3] Photon Factory, Natl. Lab. for High Energy Physics, Tsukuba-shi, Ibaraki 305, 1-1, Oho
关键词
D O I
10.1016/S0167-9317(96)00202-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High-resolution and large diameter condenser Fresnel zone plates were fabricated in a 0.35-mu m-thick Ta layer on an SiN membrane. A newly developed conversion algorithm was applied where sub-field length and position are randamized in order to suppress the evolution of small figures at pattern divided parts such as subfield boundaries in the conventional conversion algorithm. A single layer resist system was adopted to write large diameter, ultra-fine, dense ring patterns. FZPs with the outer-most linewidth of 50 nm was successfully fabricated by applying the subtractive x-ray mask fabrication process.
引用
收藏
页码:525 / 529
页数:5
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