On measuring the distance between histograms

被引:264
作者
Cha, SH
Srihari, SN
机构
[1] Pace Univ, Sch Comp Sci & Informat Syst, Pleasantville, NY 10570 USA
[2] SUNY Buffalo, CEDAR, Buffalo, NY 14260 USA
关键词
distance measure; histogram; nominal; modulo; ordinal;
D O I
10.1016/S0031-3203(01)00118-2
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
A distance measure between two histograms has applications in feature selection, image indexing and retrieval, pattern classification and clustering, etc. We propose a distance between sets of measurement values as a measure of dissimilarity of two histograms, The proposed measure has the advantage over the traditional distance measures regarding the overlap between two distributions; it takes the similarity of the non-overlapping parts into account as well as that of overlapping parts. We consider three versions Of the Univariate histogram, corresponding to whether the type of measurement is nominal, ordinal, and modulo and their computational time complexities are Theta(b), Theta(b) and O(b(2)) for each type of measurements, respectively, where b is the number of levels in histograms. (C) 2002 Pattern Recognition Society. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1355 / 1370
页数:16
相关论文
共 22 条
  • [1] [Anonymous], 2000, 7 INT WORKSH FRONT H
  • [2] Cha SH, 2000, LECT NOTES COMPUT SC, V1876, P123
  • [3] Efficient algorithms for image template and dictionary matching
    Cha, SH
    [J]. JOURNAL OF MATHEMATICAL IMAGING AND VISION, 2000, 12 (01) : 81 - 90
  • [4] CHA SH, 1998, LNCS COMPUTER VISION, V1351, P370
  • [5] CHA SH, 2000, P 15 ICPR 2000 SEPT, P21
  • [6] Chen C H, 1973, STAT PATTERN RECOGNI
  • [7] Duda R. O., 2000, Pattern Classification and Scene Analysis, V2nd
  • [8] FLICKNER M, 1995, IEEE COMPUT, V28, P23, DOI DOI 10.1109/2.410146
  • [9] Gonzalez R.C., 1992, DIGITAL IMAGE PROCES
  • [10] Hart P.E., 1973, Pattern recognition and scene analysis