Development of a new instrument for performing microwave thermal analysis

This article describes the design and operation of a new thermal analysis instrument which uses microwaves to simultaneously heat and detect thermally induced transformations in samples with masses in the range of 50 mg to 0.5 g. The data acquisition and control software developed for the instrument support a range of experimental techniques including constant power, linearly ramped power, linearly ramped temperature, and various modulated methods. Microwave thermal analysis utilizes the fact that physical or chemical alterations in a material, caused by processes such as melting, decomposition, or solid-solid phase changes, cause variations in its dielectric properties. These can be revealed by a variety of means including changes in the sample temperature, the differential temperature, or the shape of the power profile during linear heating experiments. The scope of the instrument is demonstrated with the decomposition of basic copper carbonate. The large temperature increase (similar to 100 degrees C) observed on the formation of the strongly coupling oxide indicates the potential sensitivity of using the thermal effects of dielectric changes as a means of detection. Further fine detail can be revealed by the use of derivative plots of either the applied power or the temperature. (C) 2000 American Institute of Physics. [S0034-6748(00)04101-0].